Gas jet deflection in pressurized systems

ABSTRACT

Provided herein are articles of manufacture, systems, and methods employing a gas-deflector plate in low to ultra-high vacuum systems that use differential pumping (e.g., gas-target particle accelerators, mass spectrometers, and windowless delivery ports). In certain embodiments, the gas-deflector plate is configured to be positioned between higher and lower pressure regions in a pressurized system, wherein the gas-deflector plate has a channel therethrough shaped and/or angled such that jetting gas moving through the channel enters the lower pressure region at an angle offset from the vertical axis of the gas-deflector plate and/or the channel. In other embodiments, a jet-deflector component is employed such that the jetting gas strikes such jet-deflector component and is re-directed in another direction.

CROSS-REFERENCE TO RELATED APPLICATIONS

The present application is a continuation of U.S. patent applicationSer. No. 16/930,840, filed on Jul. 16, 2020, now allowed, which claimspriority to U.S. Provisional application Ser. No. 62/876,116, filed Jul.19, 2019, which is herein incorporated by reference in its entirety.

FIELD

Provided herein are articles of manufacture, systems, and methodsemploying a gas-deflector plate in low to ultra-high vacuum systems thatuse differential pumping (e.g., gas-target particle accelerators, massspectrometers, electron-beam welding, and windowless delivery ports). Incertain embodiments, the gas-deflector plate is configured to bepositioned between higher and lower pressure regions in a pressurizedsystem, wherein the gas-deflector plate has a channel therethroughshaped and/or angled such that jetting gas moving through the channelenters the lower pressure region at an angle offset from the verticalaxis of the gas-deflector plate and/or the channel. In otherembodiments, a jet-deflector component is employed such that the jettinggas strikes such jet-deflector component and is re-directed in anotherdirection.

BACKGROUND

Target designs for particle accelerators can take the form of solid,liquid, or gas/plasma. High pressure gas from the target will naturallyflow towards lower pressure portions of the accelerator system wherehigh vacuum is required. Vacuum windows can be used to separate thetarget material from the high vacuum environment of the beamline whilepermitting the high energy particles to pass through. In the case ofhigh-flux, continuously operated accelerators the thermal stresses onthe window become unmanageable and such an approach is ineffective.

An alternative approach is to focus the beam into the target chamberthrough a narrow-diameter aperture. To combat this natural transport ofgas escaping the target, differential pumping systems are employedcomposed of pumping stages separated by additional coaxialapertures—permitting pressure ratios in excess of 10⁹ within thebeamline. In this approach, high pressure target gas expanding throughthe target aperture will accelerate while transiting into the adjacentdifferential pumping stage. In the case of a linear beamline in whichall the pumping apertures are coaxial, this phenomenon can result in aconsiderable portion of the jetting gas to coherently traverse anadjacent pumping stage. Consequently, higher pressures will bepropagated further up the course of the beamline and may interfere withbeam transport by increasing charge exchange, scatter and/or decreasingthe focusing ability and overall effectiveness of the accelerator.

SUMMARY

Provided herein are articles of manufacture, systems, and methodsemploying a gas-deflector plate that may be combined with an asymmetricnozzle in low to ultra-high vacuum systems that use differential pumping(e.g., gas-target particle accelerators, mass spectrometers, electronbeam welding, and windowless delivery ports). In certain embodiments,the gas-deflector plate is configured to be positioned between higherand lower pressure regions in a pressurized system, wherein thegas-deflector plate has a channel therethrough shaped and/or angled suchthat jetting gas moving through the channel enters the lower pressureregion at an angle offset from the vertical axis of the gas-deflectorplate and/or the channel. In other embodiments, a jet-deflectorcomponent is employed such that the jetting gas strikes suchjet-deflector component and is re-directed in another direction.

In some embodiments, provided herein are articles of manufacturecomprising: a gas-deflector plate, wherein the gas-deflector platecomprises a top surface, a bottom surface, and a channel extendingthrough the gas-deflector plate, wherein the gas-deflector plate: i) haslongitudinal and lateral axes that extend through the gas-deflectorplate that are parallel to the top and bottom surfaces, and ii) avertical axis that is perpendicular to the longitudinal and lateralaxes, wherein the gas-deflector plate is configured to be positionedbetween a higher pressure region and lower pressure region in apressurized system (e.g., as described in U.S. Pat. No. 8,837,662,herein incorporated by reference in its entirety) such that the topsurface faces the lower pressure region and the bottom surface faces thehigher pressure region, wherein the channel comprises: i) a top openingin the top surface of the gas-deflector plate, and ii) a bottom openingin the bottom surface of the gas-deflector plate, and wherein thechannel is shaped and/or angled such that jetting gas moving through thechannel from the higher pressure region to the lower pressure regionenters the lower pressure region at an angle offset from the verticalaxis.

In certain embodiments, provided herein are systems comprising: a) anyof the gas-deflector plates described herein, and b) a jet-deflectorcomponent comprising a first surface, wherein the jet-deflectorcomponent is configured to be positioned in the lower pressure regionsuch that the jetting gas entering the lower pressure region strikes thefirst surface and is re-directed in a different direction. In particularembodiments, the first surface has a shape selected from the group of:flat, concave, convex, and textured. In other embodiments, thejet-deflector component further comprises first attachment components(e.g., screws, rods, holes, nuts, etc.), and wherein the gas deflectorplate further comprises second attachment components (e.g., screws,rods, holes, nuts, etc.), and wherein the first and second attachmentcomponents allow the jet-deflector component to be attached to the gasdeflector plate (e.g., using bolts and openings for the bolts).

In some embodiments, provided herein are systems comprising: a) apressurized sub-system comprising: i) a higher pressure region, and ii)a lower pressure region; and b) a gas-deflector plate, wherein thegas-deflector plate comprises a top surface, a bottom surface, and achannel extending through the gas-deflector plate, wherein thegas-deflector plate: i) has longitudinal and lateral axes that extendthrough the gas-deflector plate that are parallel to the top and bottomsurfaces, and ii) a vertical axis that is perpendicular to thelongitudinal and lateral axes, wherein the gas-deflector plate ispositioned between the higher pressure region and the lower pressureregion such that the top surface faces the lower pressure region and thebottom surface faces the higher pressure region, wherein the channelcomprises: i) a top opening in the top surface of the gas-deflectorplate, and ii) a bottom opening in the bottom surface of thegas-deflector plate, and wherein the channel is shaped and/or angledsuch that jetting gas moving through the channel from the higherpressure region to the lower pressure region enters the lower pressureregion at an angle offset from the vertical axis. In certainembodiments, the systems further comprise: c) a jet-deflector componentcomprising a first surface, wherein the jet-deflector component ispositioned in the lower pressure region such that the jetting gasentering the lower pressure region strikes the first surface and isre-directed in a different direction.

In other embodiments, provided herein are systems comprising: a) apressurizable sub-system comprising: i) a first region, and ii) a secondregion; and b) a gas-deflector plate, wherein the gas-deflector platecomprises a top surface, a bottom surface, and a channel extendingthrough the gas-deflector plate, wherein the gas-deflector plate: i) haslongitudinal and lateral axes that extend through the gas-deflectorplate that are parallel to the top and bottom surfaces, and ii) avertical axis that is perpendicular to the longitudinal and lateralaxes, wherein the gas-deflector plate is positioned between the firstregion and the second region such that the top surface faces the secondregion and the bottom surface faces the first region, wherein thechannel comprises: i) a top opening in the top surface of thegas-deflector plate, and ii) a bottom opening in the bottom surface ofthe gas-deflector plate, and wherein the channel is shaped and/or angledsuch that jetting gas moving through the channel from the first regionto the second region enters the second region at an angle offset fromthe vertical axis.

In other embodiments, provided herein are methods comprising one or moreof: a) positioning a gas-deflector plate between a first region and asecond region of a pressurizable system, wherein the gas-deflector platecomprises a top surface, a bottom surface, and a channel extendingthrough the gas-deflector plate, wherein the gas-deflector plate: i) haslongitudinal and lateral axes that extend through the gas-deflectorplate that are parallel to the top and bottom surfaces, and ii) avertical axis that is perpendicular to the longitudinal and lateralaxes, wherein the gas-deflector plate is positioned between the firstregion and the second region such that the top surface faces the secondregion and the bottom surface faces the first region, wherein thechannel comprises: i) a top opening in the top surface of thegas-deflector plate, and ii) a bottom opening in the bottom surface ofthe gas-deflector plate, and b) activating the pressurizable system suchthat the pressurizable sub-system becomes pressurized and the firstregion is at a higher pressure than the second region thereby causingjetting gas to move through the channel from the first region to thesecond region and enter the second region at an angle offset from thevertical axis.

In certain embodiments, no physical component obstructs said jetting gascoming out of said channel into said low pressure area. In certainembodiments, the angle of the jetting gas is at least 5 or 10 degreesoffset from the vertical axis (e.g., at least 5 . . . 10 . . . 15 . . .25 . . . 35 . . . 45 . . . 55 . . . 65 . . . 75 . . . or 85 degrees). Insome embodiments, the angle of the channel is offset from the verticalaxis at least 5 or 10 degrees (e.g., at least 5 . . . 10 . . . 15 . . .25 . . . 35 . . . 45 . . . 55 . . . 65 . . . 75 . . . or 85 degrees). Inother embodiments, the top opening comprises an asymmetric opening. Infurther embodiments, the asymmetric opening is formed from first andsecond portions of the channel, wherein the first portion is across theasymmetric opening from the second portion, and wherein the secondportion has a greater angular offset from the vertical axis than thefirst portion.

In some embodiments, the pressurized system comprises a differentialpumping system. In certain embodiments, the pressurized system comprisesa particle accelerator system which comprises: i) an ion source, ii) anion accelerator, iii) a differential pumping system, and iv) a targetchamber. In some embodiments, the particle accelerator system comprisessome or all of the components of the systems found in U.S. Pat. No.8,837,662, which is herein incorporated by reference in its entirety. Infurther embodiments, the gas-deflector plate is configured to bepositioned between the target chamber and the differential pumpingsystem. In other embodiments, the target chamber comprises the higherpressure region and the differential pumping system comprises the lowerpressure region. In further embodiments, the pressurized systemcomprises a mass spectrometer. In other embodiments, the massspectrometer comprises: i) a sample chamber, ii) a differential pressurestage, and iii) an ionization chamber. In some embodiments, thegas-deflector plate is positioned between the sample chamber and thedifferential pumping stage. In other embodiments, the sample chambercomprises the higher pressure region and the differential pressure stagecomprises the lower pressure region.

In certain embodiments, the channel has a diameter of about 2.5-9.0 mm(e.g., 3.5 . . . 4.5 . . . 5.0 . . . 5.5 . . . 6.5 . . . 7.9 . . . 9.0mm) along most or all of its length. In particular embodiments, thelength of the channel is about 4-6 times the diameter of the channel. Incertain embodiments, the length of the channel is about 15-35 mm (e.g.,15 . . . 20 . . . 25 . . . or 35 mm). In other embodiments, the topopening has a diameter of about 2 times the diameter of the channel, orabout 6-18 mm (e.g., 7 . . . 10 . . . 15 . . . 17 mm). In furtherembodiments, the gas-deflector plate has a thickness between the topsurface and the bottom surface of about 13-40 mm (e.g., 13 . . . 25 . .. 34 . . . or 40 mm). In other embodiments, the gas-deflector plate hasa circular or generally circular shape, or square or generally squareshape. In other embodiments, most or all of the gas-deflector plate iscomposed of metal. In further embodiments, the metal is selected fromthe group consisting of: copper, tungsten, and stainless Steel.

In some embodiments, the gas-deflector plate comprises one or moreopenings that allow attachment to the higher pressure region and/or thelower pressure region.

In certain embodiments, the jet-deflector component is attached to thetop surface of the gas-deflector plate. In other embodiments, thepressurized sub-system is selected from the group consisting of:gas-target particle accelerators, mass spectrometers, and windowlessdelivery ports. In other embodiments, the higher pressure regioncomprises a target chamber of a particle accelerator, and the lowerpressure region comprises part of a differential pumping system. Incertain embodiments, the gas-deflector plate is composed ofheat-resistant materials.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1A shows a gas-target particle accelerator with a pair ofgas-deflector plates (30) between components with different pressures.FIG. 1B shows a plate (50) with a uniform channel (1) that is straightthrough the plate and does not reduce pressure.

FIG. 2 shows an exemplary schematic of a three-stage differentialpumping configuration with a uniform and straight channel (1).

FIG. 3A shows an exemplary gas-deflector plate (30) with a channel (70)with an asymmetric aperture (7) that causes the jetting gas (arrow; 8)to deflect from the vertical axis of the gas-deflector plate. FIG. 3Bshows the exemplary gas-deflector plate (30) from FIG. 3A with dottedlines to show the longitudinal axis (40) and lateral axis (41).

FIG. 4 shows an exemplary schematic of a three-stage differentialpumping configuration with an asymmetric aperture (7) that causesjetting gas (arrow; 8) to deflect downwards. In certain embodiments, theasymmetry in the aperture is positioned differently such that thejetting gas is directed upwards, to the left, or to the right.

FIG. 5A shows an exemplary gas-deflector plate with an asymmetricaperture (7) that causes the jetting gas (arrow; 8) to deflect from thevertical axis. The jetting gas hits a jet deflector (10) causing thejetting gas to deflect to a different direction (arrow; 12). FIG. 5Bshows the exemplary gas-deflector plate (30) from FIG. 5A with dottedlines to show the vertical axis (42).

FIG. 6 shows an exemplary schematic of a three-stage differentialpumping configuration with an asymmetric aperture and a jet deflector(10) that causes the jetting gas to travel in a different direction(arrow; 12).

FIG. 7 illustrates the use of a channel (70) with asymmetric aperture(7) for gas jet deflection in particle accelerator applications. Theparticle beam is shown as dotted line (14).

FIG. 8 illustrates the use of a channel with an asymmetric aperture forgas jet deflection in a mass spectrometer.

FIG. 9 show an exemplary jet deflector (10) bolted to a gas-deflectorplate (30) using bolts (95).

FIG. 10 shows an exemplary gas-deflector plate (30) composed of twoparts—an outer housing and an inner replaceable “puck”. In certainembodiments, these parts are held in position by other components suchthat leak paths between the high- and low-pressure regions areminimized.

DETAILED DESCRIPTION

Provided herein are articles of manufacture, systems, and methodsemploying a gas-deflector plate in low to ultra-high vacuum systems thatuse differential pumping (e.g., gas-target particle accelerators, massspectrometers, and windowless delivery ports). In certain embodiments,the gas-deflector plate is configured to be positioned between higherand lower pressure regions in a pressurized system, wherein thegas-deflector plate has a channel therethrough shaped and/or angled suchthat jetting gas moving through the channel from the higher pressureregion to the lower pressure region enters the lower pressure region atan angle offset from the vertical axis of the gas-deflector plate. Inother embodiments, a jet-deflector component is employed such that thejetting gas strikes such jet-deflector component and is re-directed inanother direction.

In certain embodiments, the present disclosure provides a gas deflectiontechnique to deflect supersonic jetting in differential pumpingapplications. In some embodiments, the deflection device is agas-deflector plate with a channel with an asymmetric aperture. Whenhigh pressure gas is expanded through the channel and asymmetricaperture, the resulting gas jet (e.g., supersonic gas jet) gains anoff-axis velocity component in the direction of the asymmetry. Inparticular embodiments, the shape and/or angle of the channel divertsthe direction of the gas jet in a differential pumping system,decreasing mass transport to lower pressure sections while reducingpumping requirements to maintain a given stage pressure. In certainembodiments, deflection of the gas jet is further improved with theaddition of a jet deflector component positioned in the direction of theaperture asymmetry.

In some embodiments, provided herein are systems, devices, and methodsproviding a jet deflection technique that mitigates the effects ofsupersonic and subsonic gas jetting in staged differential pressureapplications. In certain embodiments, provided herein are gas-deflectorplates that are angled and/or shaped (e.g., with an asymmetric aperture)which are combined with a jet deflector component to direct jetting gasoff axis of the plate. In certain embodiments, such gas-deflector platesreduce mass transport between differential pumping stages, thus reducingpumping demands and/or permitting lower base pressures for a givenconfiguration.

In certain embodiments, provided herein are systems, devices, andmethods that improves the efficiency in differentially pumped systems.That is, using the systems, devices, and methods herein allows, forexample, for greater pressure differential if all things are equal, orallows the same differential pressure using smaller and/or fewer pumps,or allows a greater aperture to exist between the high and low pressureregions. In certain embodiments, the systems, devices, and methodsherein allows for larger aperture diameter to be used for a givenpumping configuration.

Provided below is a description of certain exemplary embodimentsdepicted in the figures. It is to be understood that the applications ofthis invention are not limited to the such exemplary embodiments.Further, in particular embodiments, the gas-deflector plates andjet-deflector components described below are employed in an acceleratorsystem like the ones described in U.S. Pat. No. 8,837,662, which isherein incorporated by reference in its entirety.

FIG. 1A shows a gas-target particle accelerator (25) with a pair ofgas-deflector plates (30) between components with different pressures.An ion source (26) is connected to an accelerator (27), which isconnected to a two differential pumping system with two stages (28).Each stage is connected to a vacuum pump (29). A target chamber (32),with an ion confinement magnet (31) therearound, is connected to thedifferential pumping system with a gas-deflector plate (30) in between.The lateral axis (40) of the gas-deflector plate is shown with a dottedline.

FIG. 1B shows a plate (50) with a uniform channel (1) that is straightthrough the plate. FIG. 2 shows the use of such a uniform channel (1)positioned between a higher pressure stage (2) and a lower pressurestage (3). As a result of using a uniform channel (1), the gas jet (4)from the higher pressure stage to lower pressure stage is not offset,and instead comes straight into lower pressure stage (3). When anaperture 1 is positioned between two stages of different pressure withstage (2) being at a higher pressure than stage (3), the difference inpressure between the two stages results in a gas flow between the stagesthat will tend to equalize the pressure in the two stages. Pumps can beemployed that counteract this mass flow by transporting the gas escapinginto the lower pressure stage back into the higher pressure stage,maintaining a pressure differential. Ultimately, the pressuredifferential that can be maintained between multiple connected regionsdepends on the pumping capacity of each region, and the size of theapertures between the two regions. A commonly observed phenomena thatreduces the efficacy of coaxial differential pumping systems is theformation of gas jets between regions. If the pressures are sufficientlydifferent between any two stages, the gas coming from the higherpressure region will form a jet as it enters the lower pressure region.The jet is a continuous, coherent, and directional flow of gas that cantraverse a given pressure region and emerge in the subsequent pumpingstage largely intact. The jet effectively “bypasses” a given pumpingstage and, therefore, significantly decreases the efficacy of thedifferential pumping system. In the case of a three or more-stagesystem, a considerable portion of the jet can traverse the firstdifferential pumping stage (3), reducing the efficacy of this stagewhile increasing upstream pressure and pumping requirements in stages(5) and (6).

Such gas jet bypass issues are addressed by the devices, systems, andmethods described herein. The function of these devices, systems, andmethods is to deflect the gas jet off axis and reduce or destroy itscoherence so that the pumps in any given stage can act on the gas. Forexample, the gas-deflector plates herein with a channel angled or shaped(e.g., with an asymmetric aperture), results in a gas-jet with avelocity component off-axis direction of the aperture axis and/or thegas-deflector plate. This velocity offset, for example, is in thedirection of the asymmetry shown by arrow (8) in FIG. 3 . The deflectionlimits the gas that is directly injected into the next differentialpumping stage. In some embodiments, multiple configurations of thisasymmetric aperture are placed in series between pumping stages tomultiply this effect (see FIG. 1A).

FIG. 3A shows an exemplary gas-deflector plate (30) with a channel (70)with an asymmetric aperture (7) that causes the jetting gas (arrow; 8)to deflect from the vertical axis (beam axis) of the gas-deflectorplate. FIG. 3B shows the exemplary gas-deflector plate (30) from FIG. 3Awith dotted lines to show the longitudinal axis (40) and lateral axis(41). The longitudinal axis and lateral axis are perpendicular to thevertical axis (beam axis).

FIG. 4 shows an exemplary schematic of a three-stage differentialpumping configuration with an asymmetric aperture (7) that causesjetting gas (arrow; 8) to deflect downwards away from vertical (beam)axis. Boxes (3), (5), and (6) show differential pumping stages. Stage(2) is a higher pressure stage than stages (3), (5), and (6).

FIG. 5A shows an exemplary gas-deflector plate with a channel (70) withan asymmetric aperture (7) that causes the jetting gas (arrow; 8) todeflect from the vertical axis (beam axis). The jetting gas hits a jetdeflector component (10) causing the jetting gas to deflect to adifferent direction (arrow; 12). FIG. 5B shows the exemplarygas-deflector plate (30) from FIG. 5A with dotted lines to show thevertical axis (42) (aka “beam axis”).

FIG. 6 shows an exemplary schematic of a three-stage differentialpumping configuration with an asymmetric aperture and a jet deflectorcomponent (10) that causes the jetting gas to travel in a differentdirection (arrow; 12) offset from the vertical axis (beam axis). Boxes(3), (5), and (6) show differential pumping stages. Stage (2) is ahigher pressure stage than stages (3), (5), and (6). The addition of thejet deflector component provides additional deflection of the gas jetshown by arrow (12).

FIG. 7 illustrates the use of a channel (70) with asymmetric aperturefor gas jet deflection in particle accelerator applications. Theparticle beam is shown as dotted line (14). Using a particle acceleratoras shown in this figure, particles are accelerated into a high-pressuregas (or plasma) target (13) of enough length to decelerate the particlebeam shown by arrow (14). The pressure in the target is higher thandifferential pumping stages (15), (16), and (17). The incorporation of achannel (70), with an asymmetric aperture between the target andadjacent differential pumping stage, results in reduced pumpingrequirements and lower base pressures in stages (15), (16), and (17).The incorporation of a jet deflector component further reduces the gastransport between the target and connected differential stages.

FIG. 8 illustrates the use of a channel (70) with an asymmetric aperturefor gas jet deflection in a mass spectrometer. A mass spectrometer iscomposed of a sample chamber (19) separated from an ionization chamber(20) by differential pumping stages (21) and (22). An asymmetricaperture located between stages (19) and (21) deflects gas, enabling thesample chamber to operate at a high pressure, the ionization chamber tooperate at high-vacuum levels, while generally eliminating the gasjetting phenomenon which would ordinarily result between stages (20),(21), and (22).

We claim:
 1. A system comprising: a pressurized subsystem including ahigher pressure region and a lower pressure region; a gas-deflectorplate with a first surface facing the higher pressure region, a secondsurface facing the lower pressure region, and a channel extendingthrough the gas-deflector plate, wherein the channel includes with afirst opening in the first surface and an asymmetric opening in thesecond surface; and a jet-deflector component coupled to thegas-deflector plate.
 2. The system of claim 1, wherein the gas-deflectorplate has a longitudinal axis and a lateral axis that extends throughthe gas-deflector plate and are parallel to the first surface and thesecond surface; and wherein the gas-deflector plate has a vertical axisthat is perpendicular to the longitudinal axis and the lateral axis; andwherein gas moving through the channel from the higher pressure regionto the lower pressure region enters the lower pressure region at anangle offset from the vertical axis.
 3. The system of claim 2, whereinthe angle offset is at least 15 degrees.
 4. The system of claim 2,wherein the asymmetric opening is formed from a first portion and asecond portion of the channel, wherein the first portion is across theasymmetric opening from the second portion, and wherein the secondportion has a greater angular offset from the vertical axis than thefirst portion.
 5. The system of claim 1, wherein the pressurizedsubsystem comprises a differential pumping system.
 6. The system ofclaim 1, further including an ion source, an ion accelerator, adifferential pumping system, and a target chamber.
 7. The system ofclaim 6, wherein said gas-deflector plate is positioned between thetarget chamber and the differential pumping system.
 8. The system ofclaim 7, wherein the target chamber comprises the higher pressure regionand said differential pumping system comprises the lower pressureregion.
 9. The system of claim 1, further including a mass spectrometer.10. The system of claim 9, wherein said mass spectrometer includes asample chamber, a differential pressure stage, and an ionizationchamber.
 11. The system of claim 10, wherein the gas-deflector plate ispositioned between the sample chamber and the differential pumpingstage.
 12. The system of claim 11, wherein the sample chamber comprisesthe higher pressure region and the differential pressure stage comprisesthe lower pressure region.
 13. The system of claim 1, wherein the firstopening has a diameter of about 6-18 mm.
 14. The system of claim 1,wherein the gas-deflector plate has a thickness between first surfaceand the second surface of about 13-40 mm.
 15. The system of claim 1,wherein the gas-deflector plate has a circular or generally circularshape.
 16. The system of claim 1, wherein most or all of thegas-deflector plate is composed of a metal.
 17. The system of claim 16,wherein the metal is selected from the group consisting of: copper,tungsten, and stainless steel.
 18. The system of claim 1, wherein thegas-deflector plate comprises one or more openings that allow attachmentto the higher pressure region and/or the lower pressure region.
 19. Thesystem of claim 1, wherein the jet-deflector component is positioned inthe lower pressure region.
 20. The system of claim 19, wherein thejet-deflector component includes a surface; and wherein the gas enteringthe lower pressure region strikes the surface of the jet-deflectorcomponent and is re-directed in a different direction.